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Reliability test usually requires multiple chips to run for a long time under power supply. Take HTOL as an example, the number of samples are at least 231 pieces and the test time is up to 1000 hours. N23010 voltage precision is 0.6mV, long-term stability 80ppm/1000h, voltage ripple noise ≤2mVrms, can effectively ensure the reliability of the user test process all round protection, ensure the safety of instruments and products under test.
Ultra-high integration, saving user investment
In the process of chip R&D, flow sheet and mass production, Usually it is necessary to carry out reliability test on multiple groups of samples. In addition, the leakage current of chip or jointed board is also an important test index. The traditional scheme usually adopts multiple linear power sources with data sampling, which is troublesome to connect and occupies test space. The N23010 integrates up to 24 power channels in a 19-inch 3U chassis to support μA-level current measurement, providing a highly integrated solution for large-scale chip testing.
Fast dynamic response
N23010 is provided fast dynamic response capability, under the full voltage output, the load changes from 10% to 90%, voltage recovery to the original voltage reduction within 50mV time is less then 200μs, to ensure that the voltage or current rise waveform within high speed and no over impulse, to provide stable power supply for the chip under test.
Sequence editing
N23010 supports sequence editing function. Users can set output voltage, output current and single step running time. 100 groups of voltage and current sequences can be customized locally.
Various communication interface, meet the requirement of automatic test
support RS232, LAN, CAN port,convenient for users to build automatic test system.
To complete HTOL, LTOL, ELFR/EFR, HAST, THB, etc., and support chip leakage current measurement test within Environmental Test Chamber
