N2600 series is a digital source meter developed by NGI, which closely combines the functions of high-accuracy source and high-accuracy measurement. It integrates 5 functions (voltage source, current source, I/V/R measurement) in one instrument. The measurement range covers 200V to 1μV, 10A to 10pA, 200MΩ to 10μΩ. The maximum pulse output current can be up to 10A. The measurement resolution is 6½ digits. The basic accuracy can reach 100μV, 600pA, 300μΩ.N2600 series has built-in constant voltage source, constant current source, resistance measurement, sweep mode, signal generator, synchronous trigger, function calculator, etc., and provides PC application software for free. It can be widely used in characteristic analysis and production testing of components and modules in communication, semiconductor,computer, automotive and medical industries.
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Semiconductor Test Series
N2600 Series High Precision Source Meter (SMU)
N23020 Series Ultra High Precision Multi Channel Programmable DC Power SupplyN23020 series is a ultra-high precision, multi-channel programmable DC power supply developed for the semiconductor industry, it can provide ultra-precision, stable and pure power supply for chips, with environmental test chamber for a number of environmental reliability tests. Product voltage accuracy up to 01.mv, support nA-level current measurement, single unit within up to 16 channels, support local/remote (LAN/RS485/CAN) control, to meet the needs of chip batch, automatic testing.
N23010 Series High Precision Multi Channel Programmable DC Power SupplyN23010 series is a high-precision, multi-channel programmable DC power supply specially developed for the semiconductor industry, which can provide high-precision, stable and pure power for chips, and cooperate with the environmental test chamber for a number of environmental reliability tests. Its voltage accuracy up to 0.01%, support μA level current measurement, up to 24 channels for single unit, support local/remote (LAN/RS232/CAN) control, to meet the needs of chip batch, automatic testing.