Reliability test usually requires multiple chips to run for a long time under power supply. Take HTOL as an example, the number of samples are at least 231 pieces and the test time is up to 1000 hours. N23010 voltage precision is 0.6mV, long-term stability 80ppm/1000h, voltage ripple noise ≤2mVrms, can effectively ensure the reliability of the user test process all round protection, ensure the safety of instruments and products under test.

Ultra-high integration, saving user investment

In the process of chip R&D, flow sheet and mass production, Usually it is necessary to carry out reliability test on multiple groups of samples. In addition, the leakage current of chip or jointed board is also an important test index. The traditional scheme usually adopts multiple linear power sources with data sampling, which is troublesome to connect and occupies test space. The N23010 integrates up to 24 power channels in a 19-inch 3U chassis to support μA-level current measurement, providing a highly integrated solution for large-scale chip testing.